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The exhaustive list of topics in VLSI Design Verification And Test in which we provide Help with Homework Assignment and Help with Project is as follows:

  • Design
  • Digital VLSI Design Flow Specification
  • High level Synthesis
  • RTL Design, Logic Optimization
  • Verification and Test Planning
  • Design Representation
  • Hardware Specific Transformations
  • Scheduling, Allocation and Binding
  • Problem Specification: Scheduling
  • Allocation and Binding
  • Basic Scheduling Algorithms (Time constrained and Resource Constrained)
  • Allocation Steps
  • Unit Selection
  • Functional Unit Binding
  • Storage Binding
  • Interconnect Binding
  • Allocation Techniques
  • Clique Partitioning
  • Left-Edge Algorithm
  • Iterative Refinement
  • Logic Optimization and Synthesis
  • Heuristic Minimization of Two-Level Circuits: Espresso
  • Finite State Machine Synthesis
  • Multi-Level Logic Synthesis
  • Multi-Level Minimization
  • Technology Mapping
  • Binary Decision Diagram
  • Construction
  • Reduction rules and Algorithms
  • ROBDDs
  • Operation on BDDs and its Algorithms
  • Representation of Sequential Circuits
  • Temporal Logic
  • Basic Operators
  • Syntax and Semantics of LTL
  • CTL and CLT*
  • Equivalence and Expressive Power
  • Model Checking
  • Verification
  • Specification and Modelling
  • Model Checking Algorithm
  • Symbolic Model Checking
  • Automata and its use in Verification
  • Automata Theoretic Model Checking
  • Practical Examples with SMV
  • Digital Testing
  • Test process and Test economics
  • Functional vs. Structural Testing Defects
  • Errors
  • Faults and Fault Modeling
  • Fault Equivalence
  • Fault Dominance
  • Fault Collapsing
  • Checkpoint Theorem
  • Fault Simulation and Testability Measures
  • Circuit Modeling and Algorithms for Fault Simulation
  • Serial Fault Simulation
  • Parallel Fault Simulation
  • Deductive Fault Simulation
  • Concurrent Fault Simulation
  • Combinational SCOAP Measures
  • Sequential SCOAP Measures
  • Combinational Circuit Test Pattern Generation
  • Automatic Test Pattern Generation (ATPG)
  • ATPG Algebras
  • Standard ATPG Algorithms.
  • D-Calculus and D-Algorithm.
  • Basics of PODEM and FAN.
  • Sequential Circuit Testing and Scan Chains
  • ATPG for Single-Clock Synchronous Circuits.
  • Use of Nine-Valued Logic and Time-Frame Expansion Methods.
  • Complexity of Sequential ATPG.
  • Scan Chain based Sequential Circuit Testing.
  • Scan Cell Design.
  • Design variations of Scan Chains.
  • Sequential Testing based on Scan Chains.
  • Overheads of Scan Design.
  • Partial-Scan Design.
  • Built in Self test (BIST)
  • BIST architecture BIST Test Pattern Generation.
  • Response Compaction.
  • Response Analysis.
  • Memory BIST.
  • March Test.
  • BIST with MISR.
  • Neighborhood Pattern Sensitive Fault Test.
  • Transparent Memory BIST.